Techniques for providing multiple delay paths in a delay circuit

ABSTRACT

A feedback loop circuit includes a phase detector and delay circuits. The phase detector generates an output signal based on a delayed periodic signal. The delay circuits are coupled in a delay chain that delays the delayed periodic signal. Each of the delay circuits includes variable delay blocks and fixed delay blocks that are coupled to form at least two delay paths for an input signal through the delay circuit to generate a delayed output signal. Delays of the variable delay blocks in the delay circuits vary based on the output signal of the phase detector. Each of the delay circuits reroutes the input signal through a different one of the delay paths to generate the delayed output signal based on the output signal of the phase detector during operation of the feedback loop circuit.

BACKGROUND OF THE INVENTION

The present invention relates to electronic circuits, and moreparticularly, to techniques for providing multiple delay paths in adelay circuit.

FIG. 1A illustrates a prior art delay line circuit used in adelay-locked loop (DLL) circuit. The delay line circuit of FIG. 1Aincludes 16 delay circuits 10-25 that are coupled in series and a 5-to-1multiplexer circuit 50. Delay circuits 10-25 delay a reference clocksignal REFCK. A counter control signal CCS controls the delays of thedelay circuits 10-25. Multiplexer 50 selects a delayed version of thereference clock signal from the output of one of the delay circuits 15,17, 19, 21, or 25 to generate a feedback clock signal FBCK based on thelogic states of static select signals. The logic states of the staticselect signals remain constant during the operation of the DLL. FBCK istransmitted to a phase detector in the DLL.

Each of the delay circuits 10-25 includes the circuit architecture shownin FIG. 1B. FIG. 1B includes 1X delay circuits 101-108 and 2-to-1multiplexer 110. Each of the delay circuits 101-108 includes a currentstarving inverter coupled in series with a standard CMOS inverter. Eachof the current starving inverters in delay circuits 101-108 is avariable delay circuit that includes 9 PMOS transistors coupled inparallel and 9 NMOS transistors coupled in parallel. The PMOS and NMOStransistors can generate 9 different delay options for the currentstarving inverter.

Delay circuits 101-104 are coupled in series to delay the input clocksignal at the Input of delay circuit 101 to generate a delayed clocksignal at the high frequency input of multiplexer 110. Delay circuits101-108 are coupled in series to delay the input clock signal at theInput of delay circuit 101 to generate a delayed clock signal at the lowfrequency input of multiplexer 110. Multiplexer 110 selects either thedelayed clock signal at the low frequency input or the delayed clocksignal at the high frequency input as an output clock signal at theOutput based on the logic state of a static select signal. The logicstate of the static select signal remains constant during the operationof the DLL. The delay options in delay circuits 101-108 are dynamicallyadjusted by the combination of a phase detector and counter circuitduring operation of the DLL.

BRIEF SUMMARY OF THE INVENTION

According to an embodiment, a feedback loop circuit includes a phasedetector and delay circuits. The phase detector generates an outputsignal based on a delayed periodic signal. The delay circuits arecoupled in a delay chain that delays the delayed periodic signal. Eachof the delay circuits includes variable delay blocks and fixed delayblocks that are coupled to form at least two delay paths for an inputsignal through the delay circuit to generate a delayed output signal.Delays of the variable delay blocks in the delay circuits vary based onthe output signal of the phase detector. Each of the delay circuitsreroutes the input signal through a different one of the delay paths togenerate the delayed output signal based on the output signal of thephase detector during operation of the feedback loop circuit.

According another embodiment, a feedback loop circuit includes a phasedetector and a delay line. The phase detector generates an output signalin response to a delayed periodic signal. The delay line includes delaycircuits coupled in series that delay a periodic signal to provide adelay to the delayed periodic signal. Each of the delay circuitsincludes adjustable delay blocks that are configurable to route an inputsignal through either one of at least two different delay paths throughthe adjustable delay blocks to generate a delayed output signal. Delaysof a first set of the adjustable delay blocks vary based on the outputsignal of the phase detector. Delays of a second set of the adjustabledelay blocks remain constant in response to fixed delay signals when thefeedback loop circuit is operating.

Various objects, features, and advantages of the present invention willbecome apparent upon consideration of the following detailed descriptionand the accompanying drawings.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1A illustrates a prior art delay line circuit used in adelay-locked loop (DLL) circuit.

FIG. 1B illustrates the circuit architecture of each of the delaycircuits shown in FIG. 1A.

FIG. 2 illustrates an example of a delay-locked loop (DLL) circuit,according to an embodiment of the present invention.

FIG. 3 illustrates an example of a variable delay circuit, according toan embodiment of the present invention.

FIG. 4 illustrates an example of a variable delay switch circuit,according to an embodiment of the present invention.

FIG. 5 is a schematic diagram that illustrates an example of a currentstarving inverter circuit.

FIG. 6 illustrates another example of a variable delay circuit,according to an embodiment of the present invention.

FIG. 7 illustrates an example of registers that can be used to generateselect signals for selecting different paths through a variable delaycircuit, according to an embodiment of the present invention.

FIG. 8 is a timing diagram that illustrates an example of the input andoutput clock signals of the variable delay circuit of FIG. 6, accordingto an embodiment of the present invention.

FIG. 9 illustrates another example of a variable delay circuit,according to an embodiment of the present invention.

FIG. 10 is a simplified partial block diagram of a field programmablegate array (FPGA) that can include aspects of the present invention.

FIG. 11 shows a block diagram of an exemplary digital system that canembody techniques of the present invention.

DETAILED DESCRIPTION OF THE INVENTION

A delay-locked loop (DLL) circuit containing the circuit architecture ofFIGS. 1A and 1B has a number of different issues. Because the number ofdelay circuits 10-25 in FIG. 1A used to generate FBCK changes to supportdifferent frequencies, it may become difficult to achieve a requiredphase shift over the supported frequency range. For example, double datarate (DDR) memory data capture requires a reliable phase shift of 90degrees to place a sampling clock signal in the middle of the datasampling window. This phase shift is not possible with 6 or 10 delaycircuits in the delay line, which may cause problems in data and clocksignals having higher frequencies. In addition, higher frequency clocksignals require a smaller number of delay circuits in the delay line,which reduces the phase options that are important to support featuressuch as leveling for DDR3 memory applications.

To support a wide continuous frequency range in a DLL, each frequencyrange that is supported by the delay line of FIGS. 1A-1B should have asufficient overlap across process, supply voltage, and temperature (PVT)corners. The overlap between supported frequency ranges causes anoverall smaller continuous frequency range. Designing delay circuitswith constraints on minimum and maximum frequencies across PVT cornersis very difficult and limits the choices of the delay circuit structure.Most of the variable delay of the delay circuits is wasted in meetingthe overlap constraints across PVT corners.

The multi-stage architecture of FIGS. 1A-1B impacts the intrinsic delayand thus the maximum frequency achievable by the DLL without reducingthe number of stages. The structure is not symmetric at every pointalong the delay path of delay circuits 101-108.

Because delay circuits 101-108 are buffers, any duty cycle distortioncaused by one of delay circuits 101-108 accumulates along the path. Thedistortion is worst for the 16 stage high frequency delay path. Thelimitations of hitting overlap constraints usually results in each ofthe delay circuits 10-25 having many smaller delay circuits. Typically,each additional delay circuit added to a delay line in a DLL hasprogressively less benefits. For example, the use of different channellengths can cause uneven delay steps in the delay circuits.

FIG. 2 illustrates an example of a delay-locked loop (DLL) circuit 200,according to an embodiment of the present invention. DLL 200 shown inFIG. 2 includes 8 delay circuit elements 201A-201H, phase detector 202,up/down counter 203, bus 210, and frequency divider circuits 214 and216.

Delay circuit elements 201A-201H, phase detector 202, up/down counter203, bus 210, and frequency divider circuits 214 and 216 form adigitally controlled delay-locked loop (DLL) circuit. DLL 200 can haveany suitable number of delay circuit elements 201 coupled in series in adelay chain. Eight delay circuit elements 201 are shown in FIG. 2 merelyas an example.

Circuit 200 is typically fabricated on an integrated circuit. Circuitsof the present invention can, for example, be fabricated on anapplication specific integrated circuit (ASIC) or a programmable logicintegrated circuit, such as a field programmable gate array (FPGA).

Frequency divider circuit 214 divides the frequency of input clocksignal INCK by 8 to generate a frequency divided clock signal INCKD. Thefrequency divided clock signal INCKD is routed to an input of delaycircuit element 201A. Delay circuit elements 201A-201H are coupledtogether in series in the delay path of clock signal INCKD to form adelay chain. Delay circuit elements 201A-201H delay clock signal INCKDto generate a periodic feedback clock signal FBCK. The 8 delay circuitelements 201A-201H generate a delay in FBCK that varies based on changesin the logic states of count signals CT[1:Q].

Each of the delay circuit elements 201A-201H in the delay chain has thesame delay at any given time. The delay of delay circuit elements201A-201H is referred to as 1X. Each of the delay circuit elements201A-201H adds an additional delay of 1X to feedback clock signal FBCKrelative to clock signal INCKD. As a result, the feedback clock signalFBCK is delayed by 8X relative to the clock signal INCKD.

When INCK and FBCK are aligned in phase, each of the delay circuitelements 201A-201H delays FBCK by a delay of 45°, and delay circuitelements 201A-201H together delay FBCK by 360°. 45° refers to one-eighthof a period of INCK, and 360° refers to one full period of INCK. Thus,FBCK is delayed by one full period of INCK after the phase of INCKD.FBCK and INCKD have the same frequency.

The 8 output clock signals of the 8 delay circuit elements 201A-201Hhave relative phase offsets of 45°, 90°, 135°, 180°, 225°, 270°, 315°,and 360°, respectively. These phase offsets are relative to a period ofINCK. If the periods of bits in an input data signal are one-half theperiod of a sampling clock signal, the 8 output clock signals of delaycircuit elements 201A-201H can be used to generate 90° phase shifts inthe sampling clock signal relative to the bit periods of the input datasignal.

In one embodiment, each of the delay circuit elements 201A-201H has thesame delay circuit architecture and the same size transistors as each ofthe other delay circuit elements 201A-201H.

Input clock signal INCK is routed to a first input terminal of phasedetector 202. Frequency divider circuit 216 divides the frequency ofinput clock signal INCK by 8 to generate a second frequency dividedclock signal. The second frequency divided clock signal is routed to aclock CLK input terminal of up/down counter 203. The feedback clocksignal FBCK is generated at an output terminal of delay circuit element201H and is routed to a second input terminal of phase detector 202.Phase detector 202 compares the phase of the feedback clock signal FBCKto the phase of the input clock signal INCK to generate a digital UP/DNsignal.

Up/down counter 203 generates a Q number of digital count signalsCT[1:Q] in response to the second frequency divided clock signal and theUP/DN signal. Up/down counter 203 can, for example, generate 5 digitalcount signals (Q=5). The digital count signals are referred to as countsignals CT[1:Q]. The count signals CT[1:Q] are transmitted in parallelthrough a bus 210 to input terminals of each of the delay circuitelements 201A-201H. The count signals CT[1:Q] are Gray coded, forexample, using a simple Gray code. The Gray coded value of the countsignals CT[1:Q] determines the delay of each of the delay circuitelements 201A-201H.

The function of the delay-locked loop (DLL) circuit 200 is to generate acombined delay through delay circuit elements 201A-201H that causes thephase of FBCK to be 360 degrees behind the phase of INCK. 360 degreesrefers to a full period of INCK. DLL 200 adjusts the variable delay ofdelay circuit elements 201A-201H by varying the Gray coded value ofcount signals CT[1:Q], which control the variable delays of delaycircuit elements 201A-201H.

When the phase of the feedback clock signal FBCK is less than 360°behind the phase of the input clock signal INCK, phase detector 202generates a logic high state in the UP/DN signal. When the UP/DN signalis in a logic high state, up/down counter 203 increases the Gray codedvalue of the count signals CT[1:Q], causing the delay of each of thedelay circuit elements 201A-201H to increase.

When the phase of the feedback clock signal FBCK is more than 360°behind the phase of the input clock signal INCK, phase detector 202generates a logic low state in the UP/DN signal. When the UP/DN signalis in a logic low state, up/down counter 203 decreases the Gray codedvalue of the count signals CT[1:Q], causing the delay of each of thedelay circuit elements 201A-201H to decrease.

The change in the delay of each of the delay circuit elements 201A-201Hthat occurs when the Gray coded value of the count signals CT[1:Q]increases or decreases by one is referred to as the step delay D_(STEP).When the Gray coded value of the count signals CT[1:Q] increases by 1,the total delay of the delay chain formed by delay circuit elements201A-201H increases by 8×D_(STEP). When the Gray coded value of thecount signals CT[1:Q] decreases by 1, the total delay of the delay chainformed by delay circuit elements 201A-201H decreases by 8×D_(STEP).

When the combined delay of delay circuit elements 201A-201H causes thephase of the FBCK signal to be 360 degrees behind the phase of the inputclock signal INCK, DLL circuit 200 is in lock mode. In the lock mode ofthe DLL, counter 203 maintains the logic states of the count signalsCT[1:Q] constant. Phase detector 202 monitors when DLL 200 is in lockmode. When phase detector 202 detects that DLL 200 is not in lock mode,an enable signal (not shown) that is transmitted from phase detector 202to counter 203 causes counter 203 to adjust the count signals CT[1:Q] inresponse to the UP/DN signal. When phase detector 202 detects that DLL200 is in lock mode, phase detector 202 causes the enable signal totransition to a state that causes counter 203 to maintain the countsignals CT[1:Q] in constant logic states. When DLL 200 goes out of lockmode, phase detector 202 causes the enable signal to allow counter 203to adjust the count signals again.

FIG. 3 illustrates an example of a variable delay circuit, according toan embodiment of the present invention. The variable delay circuit ofFIG. 3 includes decoder 301, variable delay elements 302-303, fixeddelay circuits 304-307, and multiplexer 310. The variable delay circuitof FIG. 3 is an example of each of the delay circuit elements 201A-201Hshown in FIG. 2. Thus, in one embodiment, each of the 8 delay circuitelements 201A-201H includes decoder 301, variable delay elements302-303, fixed delay circuits 304-307, and multiplexer 310 coupled asshown in FIG. 3.

A decoder circuit 301 decodes the Gray coded count signals CT[1:Q] togenerate decoded control signals DCS and DCSM. Decoded control signalsDCS and DCSM can include any appropriate number of individual digitalsignals. In DLL 200, each of the delay circuit elements 201A-201H has adecoder circuit 301 that controls the variable delay circuits withinthat delay circuit element.

The variable delay circuit of FIG. 3 is configured to delay an inputclock signal to generate an output clock signal. Variable delay elements302-303 are coupled in series. Variable delay element 302 delays theinput clock signal to generate a delayed output clock signal. Variabledelay element 303 delays the delayed output clock signal of variabledelay circuit 302 to generate a delayed output clock signal that istransmitted to an input of fixed delay circuit 304. Decoded controlsignals DCS control the delays of variable delay elements 302-303. Thedelays of variable delay elements 302-303 vary based on changes in thelogic states of control signals DCS.

Fixed delay circuit 304 delays the delayed output clock signal ofvariable delay element 303 to generate a delayed output clock signal.Fixed delay circuit 305 is coupled to delay the delayed output clocksignal of fixed delay circuit 304 to generate a delayed output clocksignal. Fixed delay circuit 306 is coupled to delay the delayed outputclock signal of fixed delay circuit 305 to generate a delayed outputclock signal. Fixed delay circuit 307 is coupled to delay the delayedoutput clock signal of fixed delay circuit 306 to generate a delayedoutput clock signal.

Multiplexer 310 selects the delayed output clock signal of one of fixeddelay circuits 304-307 based on the logic states of decoded controlsignals DCSM. Decoded control signals DCSM determine which of thedelayed output clock signals of fixed delay circuits 304-307 is selectedto be the output signal of multiplexer 310. Multiplexer 310 transmitsthe selected delayed output clock signal to its output as the outputclock signal of the variable delay circuit of FIG. 3.

FIG. 4 illustrates an example of a variable delay switch circuit 400,according to an embodiment of the present invention. Variable delayswitch circuit 400 is an example of each of the variable delay elements302-303 in FIG. 3. Variable delay switch circuit 400 includes NAND logicgate 401, current starving inverter 402, and inverter circuit 403.Circuits 401-403 are coupled in series to delay a clock signal at inputIN of NAND gate 401 to generate a delayed clock signal at output O ofinverter 403. NAND gate 401 also receives an input select signal atinput S.

FIG. 5 is a schematic diagram that illustrates an example of anarchitecture of current starving inverter circuit 402. The currentstarving inverter shown in FIG. 5 is in delay circuits 101-108 in theprior art design of FIG. 1B. The current starving inverter 402 shown inFIG. 5 is also an example of the current starving inverter circuit 402in the variable delay switch circuit 400 of FIG. 4.

In FIG. 5, current starving inverter circuit 402 includes p-channelmetal oxide semiconductor field-effect transistors (MOSFETs) 501, 503,and 502A-502H. Current starving inverter circuit 402 also includesn-channel MOSFETs 504, 505, and 506A-506H. Although current starvinginverter circuit 402 includes 8 transistors 502A-502H and 8 transistors506A-506H, current starving inverter circuit 402 can include anysuitable number of transistors 502 and 506.

Transistors 503 and 504 are coupled together to form an inverter. Thegate terminals of transistors 503 and 504 are coupled to receive inputclock signal CSIN from the output of NAND gate 401, the drains oftransistors 503 and 504 are coupled to the input of inverter 403, andinverter 403 generates the delayed output clock signal of circuit 400 atoutput O.

The gate of p-channel transistor 501 is coupled to ground, the source oftransistor 501 is coupled to supply voltage VCC, and the drain oftransistor 501 is coupled to the source of transistor 503. When thesupply voltage VCC is at its nominal operating voltage, transistor 501is on to conduct current in its saturation region from supply voltageVCC to transistor 503. The gate of n-channel transistor 505 is coupledto supply voltage VCC, the source of transistor 505 is coupled toground, and the drain of transistor 505 is coupled to the source oftransistor 504. When the supply voltage VCC is at its nominal operatingvoltage, transistor 505 is on to conduct current in its saturationregion from transistor 504 to ground.

P-channel transistors 502A-502H are coupled in parallel between thesupply voltage VCC and the source of transistor 503. N-channeltransistors 506A-506H are coupled in parallel between the source oftransistor 504 and ground.

Decoded control signals DCS are used to generate gate control signalsV1-V8 and VB1-VB8. Gate control signals V1-V8 are transmitted to thegates of p-channel transistors 502A-502H, respectively. Gate controlsignals VB1-VB8 are transmitted to the gates of n-channel transistors506A-506H, respectively. Gate control signals VB1-VB8 are the logicalinverses of gate control signals V1-V8, respectively.

The Gray coded value of the count signals CT[1:Q] determines the numberof transistors 502 and 506 that are turned on to supply current throughtransistors 503-504. Counter circuit 203 adjusts the Gray coded value ofthe count signals to vary the delay of current starving inverters 402 byvarying the number of transistor pairs 502/506 that are turned on.

Decoder 301 selects the logic states of the V1-V8 and VB1-VB8 controlsignals based on the Gray coded value of the count signals CT[1:Q].Decoder 301 generates an additional 1 in the V1-V8 signals in responseto each increase of 1 in the Gray coded value of the count signals.Decoder 301 generates an additional 0 in the V1-V8 signals in responseto each decrease of 1 in the Gray coded value of the count signals. Alogic high state (1) at the gate of one of transistors 502A-502H turnsoff that transistor, and a logic low state (0) at the gate of one oftransistors 502A-502H turns on that transistor in its saturation region.A logic low state (0) at the gate of one of transistors 506A-506H turnsoff that transistor, and a logic high state (1) at the gate of one oftransistors 506A-506H turns on that transistor in its saturation region.Thus, each increase in the count signals CT[1:Q] decreases the currentthrough current starving inverter 402, and each decrease in the countsignals CT[1:Q] increases the current through current starving inverter402.

Current starving inverter 402 generates a minimum delay D_(MIN) and amaximum current I_(MAX) through transistors 503-504 when all of thetransistors 502A-502H and 506A-506H are on and conducting current intheir saturation regions. Current starving inverter 402 generates amaximum delay D_(MAX) and a minimum current I_(MIN) through transistors503-504 when all of the transistors 502A-502H and 506A-506H are off andnot conducting current. The minimum current I_(MIN) is generated bytransistors 501 and 505. The capacitance when I_(MAX) is flowing throughtransistors 503-504 is the same as the capacitance when I_(MIN) isflowing through transistors 503-504.

According to one embodiment, the width-to-length (W:L) channel ratio ofeach of the transistors 502A-502H can be the same, and the W:L channelratio of each of the transistors 506A-506H can be the same. In thisembodiment, the current through transistors 503-504 ideally increaseslinearly with each additional transistor pair 502/506 that is turned on.However, each additional transistor 502 adds capacitance at the sourceof transistor 503, and each additional transistor 506 adds capacitanceat the source of transistor 504. According to another embodiment, theW:L channel ratios of transistors 502A-502H increase from left to rightin FIG. 5, and the W:L channel ratios of transistors 506A-506H increasefrom left to right in FIG. 5. During the design of current starvinginverter 402, the W:L channel ratios of transistors 502 and 506 can beselected to cause current starving inverter 402 to generate a desiredstep delay.

FIG. 6 illustrates an example of a variable delay circuit 600, accordingto an embodiment of the present invention. Variable delay circuit 600 isan example of each of the 1X delay circuit elements 201A-201H shown inFIG. 2. Thus, in one embodiment, each of the 1X delay circuit elements201A-201H includes the circuitry of variable delay circuit 600.According to another embodiment, variable delay circuit 600 can be usedin a ring oscillator in a phase-locked loop (PLL) circuit.

Variable delay circuit 600 includes 8 variable delay switches 601-608.Variable delay switch circuit 400 shown in FIGS. 4-5 is an examplecircuit architecture for each one of the variable delay switches601-608. Because variable delay switches 601-608 have the same circuitarchitecture, process variations have the same effects on the delays ofswitches 601-608.

Variable delay circuit 600 delays an input clock signal CLKIN togenerate an output clock signal CLKOUT. Eight decoded control signalsDCS[1:8] are transmitted from decoder 301 to inputs of variable delayswitches 601 and 603, and eight additional decoded control signalsDCS[9:16] are transmitted from decoder 301 to inputs of variable delayswitch 602, as shown in FIG. 6. Decoded control signals DCS[1:8] controlthe delays of variable delay switches 601 and 603, and decoded controlsignals DCS[9:16] control the delay of variable delay switch 602.

The delay that variable delay circuit 600 provides to CLKOUT relative toCLKIN can be varied by changing the logic states of decoded controlsignals DCS. Decoded control signals DCS[1:8] vary the delays ofvariable delay switches 601 and 603 based on changes in the logic statesof the count signals CT[1:Q] from counter 203. Decoded control signalsDCS[9:16] vary the delay of variable delay switch 602 based on changesin the logic states of the count signals CT[1:Q] from counter 203. Forexample, decoded control signals DCS[1:16] can vary the delays ofvariable delay switches 601-603 by turning on or turning off more oftransistors 502A-502H and 506A-506H in current starving inverters 402.

Fixed delay control signals FDS are transmitted to inputs of variabledelay switches 604-608, as shown in FIG. 6. Fixed delay control signalsFDS are set to constant logic states that do not vary during theoperation of DLL 200. Fixed delay control signals FDS cause the delaysof variable delay switches 604-608 to be set to their smallestprogrammable delay values. For example, fixed delay control signals FDScan be set to logic states that cause all 16 of transistors 502A-502Hand 506A-506H to be turned on in each of variable delay switches604-608, so that switches 604-608 provide their minimum programmabledelay values to their output clock signals at outputs O. In thisexample, signals FDS set the logic states of signals V1-V8 and VB1-VB8in switches 604-608. Control signals FDS cause variable delay switches604-608 to remain at their minimum programmable delay values during theoperation of DLL 200.

The delay that variable delay circuit 600 provides to output clocksignal CLKOUT relative to input clock signal CLKIN can also be varied bychanging the delay path that CLKIN takes through variable delay switches601-608 to generate CLKOUT. The logic states of control signals SELA,SELA#, SELB, SELB#, and SELC control the delay path that CLKIN takesthrough variable delay switches 601-608 to generate CLKOUT. The logicstates of control signals SELA, SELA#, SELB, SELB#, and SELC are variedto change the path that CLKIN takes through variable delay switches601-608 to generate CLKOUT. Signal SELA# is the logical inverse ofsignal SELA, and signal SELB# is the logical inverse of signal SELB. TheSELA, SELA#, SELB, SELB#, and SELC signals are generated in response todecoded control signals. These decoded control signals are generated bya decoder in response to the count signals CT[1:Q] from counter 203.

Signal SELA is transmitted to the select input S of variable delayswitch 601, and signal SELA# is transmitted to the select input S ofvariable delay switch 603. When signal SELA is in a logic high state,and signal SELA# is in a logic low state, CLKIN propagates throughvariable delay switch 601 from its IN input to its O output and thenthrough variable delay switch 602 from its IN input to its O output asoutput clock signal CLKOUT. In this example, CLKIN is not routed throughvariable delay switches 603-608.

Signal SELB is transmitted to the select input S of variable delayswitch 604, and signal SELB# is transmitted to the select input S ofvariable delay switch 606. When signals SELA and SELB# are in logic lowstates, and signals SELA# and SELB are in logic high states, CLKINpropagates through variable delay switches 603, 604, 605, and 602, inthat order, to generate CLKOUT. CLKIN propagates through variable delayswitches 603-605 in serial from their IN inputs to their O outputs. Theclock signal at the O output of variable delay switch 605 thenpropagates through variable delay switch 602 from its S input to its Ooutput as CLKOUT. In this example, CLKIN propagates through two variabledelay switches 602-603 having variable delays and two delay switches604-605 that are programmed to have fixed delays.

Signal SELC is transmitted to the select input S of variable delayswitch 607, and the supply voltage VCC (representing a logic high state)is transmitted to the select input S of variable delay switch 608. Whensignals SELA and SELB are in logic low states, and signals SELA#, SELB#,and SELC are in logic high states, CLKIN propagates through variabledelay switches 603, 606, 607, 608, 605, and 602, in that order, togenerate CLKOUT. CLKIN propagates through variable delay switches 603and 606-608 in serial from their IN inputs to their O outputs. The clocksignal at the O output of variable delay switch 608 then propagatesthrough variable delay switch 605 from its S input to its O output. Theclock signal at the O output of variable delay switch 605 thenpropagates through variable delay switch 602 from its S input to its Ooutput as CLKOUT. In this example, CLKIN propagates through twovariables delay switches 602-603 having variable delays and four delayswitches 605-608 that are programmed to have fixed delays.

Each of the possible combinations of the SELA, SELA#, SELB, SELB#, andSELC signals described above causes an even number of variable delayswitches to be located in the path between CLKIN and CLKOUT. As aresult, the logic state of CLKOUT is not inverted relative to the logicstate of CLKIN.

An example of the operation of circuit 600 is now described. Initially,SELA is in a logic high state, SELA# is in a logic low state, and CLKINis routed only through variable delay switches 601-602. In order toincrease the delay of variable delay circuit 600, DLL 200 initiallyincreases the delays of variable delay switches 601-602 by changing thelogic states of controls signals DCS[1:16] based on changes in the Graycoded value of count signals CT[1:Q]. When the delays of variable delayswitches 601-602 are at their maximum values, DLL 200 reroutes CLKINthrough switches 603-605 and 602, as described above, and at the sametime, DLL 200 sets the delays of switches 602-603 to their minimumvalues. In one embodiment, the maximum delay of switch 602 minus theminimum delay of switch 602 plus the maximum delay of switch 603 minusthe minimum delay of switch 603 equals the combined delays of switches604-605, and the delay of circuit 600 does not change when CLKIN isrerouted through switches 603-605 and 602.

Subsequently, DLL 200 increases the delay of circuit 600 by increasingthe delays of variable delay switches 602-603. DLL 200 increases thedelays of variable delay switches 602-603 by changing the logic statesof DCS[1:16] based on changes in the Gray coded value of count signalsCT[1:Q]. When variable delay switches 602-603 are generating theirmaximum delays, DLL 200 reroutes CLKIN through switches 603, 606-608,605, and 602, as described above, and at the same time, DLL 200 sets thedelays of switches 602-603 to their minimum values. In one embodiment,the maximum delay of switch 602 minus the minimum delay of switch 602plus the maximum delay of switch 603 minus the minimum delay of switch603 equals the combined delays of switches 607-608, and the delay ofcircuit 600 does not change when CLKIN is rerouted through switches 603,606-608, 605, and 602. Subsequently, DLL 200 increases the delay ofcircuit 600 by increasing the delays of variable delay switches 602-603again.

Thus, variable delay circuit 600 can increase its delay beyond the delayof the variable delay switches by rerouting the input clock signal CLKINthrough different delay paths. The different delay paths throughvariable delay circuit 600 can support different frequency ranges forthe input reference clock signal INCK of DLL 200. The shortest delaypath through switches 601-602 can be used to support high frequencies inINCK. The delay path through switches 603-605 and 602 can be used tosupport mid-range frequencies in INCK. The longest delay path throughswitches 603, 606-608, 605, and 602 can be used to support the lowestfrequencies in INCK. Variable delay circuit 600 provides DLL 200 with awide frequency range without having to design for frequency overlap.

Thus, variable delay circuit 600 provides a fast intrinsic path for highfrequencies in input clock signals INCK and CLKIN. For low frequenciesin INCK and CLKIN, an appropriate number of fixed delay stages are addedto the path that CLKIN takes through variable delay circuit 600, asdescribed above. Decoder 301 dynamically adds the fixed delay switchesas needed to provide a uniform wide frequency range for DLL 200.Variable delay circuit 600 is designed for the highest frequencyrequired in INCK by adjusting the delay of variable delay switches601-602. Variable delay circuit 600 achieves low frequency operation byadding the fixed delay switches. The fixed delay switches are coupled inparallel with the high frequency delay path through switches 601-602.The fixed delay switches do not affect the high frequency path. Variabledelay circuit 600 needs only enough flexibility to compensate for PVTdrift. Frequency lock is performed by adjusting the path that CLKINtakes through switches 601-608.

Table 1 below illustrates the operation of variable delay circuit 600.In this example, counter 203 starts counting up from 0. The exampledelays shown in Table 1 for count values 0-8 occur as the delays ofswitches 601-602 are increased from their minimum values to theirmaximum values. At count value 9, DLL 200 reroutes CLKIN throughswitches 603-605 and 602 and sets the delays of switches 602-603 back totheir minimum values. In Table 1, the abbreviation ps refers topicoseconds, and variable delay switches 601-603 are assumed to haveonly 4 transistors 502 and only 4 transistors 506 that provide 4 steps.Each step adds an additional delay of 10 ps. Also in Table 1, the totaldelay shown in each row of the seventh column is obtained by addingtogether the delays from the second through the sixth columns of thatrow.

TABLE 1 Value Variable Delay Variable Delay Fixed Delay of CT Switch601/603 Switch 602 from Path Total [1:Q] Minimum Variable MinimumVariable Changing Delay 0 30 ps  0 ps 30 ps  0 ps  0 ps  60 ps 1 30 ps10 ps 30 ps  0 ps  0 ps  70 ps 2 30 ps 20 ps 30 ps  0 ps  0 ps  80 ps 330 ps 30 ps 30 ps  0 ps  0 ps  90 ps 4 30 ps 40 ps 30 ps  0 ps  0 ps 100ps 5 30 ps 40 ps 30 ps 10 ps  0 ps 110 ps 6 30 ps 40 ps 30 ps 20 ps  0ps 120 ps 7 30 ps 40 ps 30 ps 30 ps  0 ps 130 ps 8 30 ps 40 ps 30 ps 40ps  0 ps 140 ps 9 30 ps  0 ps 30 ps  0 ps 80 ps 140 ps 10 30 ps 10 ps 30ps  0 ps 80 ps 150 ps 11 30 ps 20 ps 30 ps  0 ps 80 ps 160 ps

Because count signals CT[1:Q] are Gray coded, every increment anddecrement in the value of count signals CT[1:Q] causes only 1 bit tochange in the control signals DCS[1:16] that control the delay ofvariable delay circuit 600. Only one of the variable delay switches thatare coupled in the delay path of CLKIN changes its delay in response toeach change in a bit in the DCS[1:16] control signals. When the value ofthe count signals is 9, variable delay circuit 600 changes the path ofCLKIN and reduces the delay of switch 602 to its minimum value, whichmay introduce jitter into CLKOUT depending on timing delay. To reducejitter in CLKOUT, circuit 600 switches between the different delay pathsonly when the CLKIN and CLKOUT signals both have stable logic states.When CLKIN and CLKOUT both have stable logic states, no additionaljitter is introduced into CLKOUT, because there are no edge transitionsgoing through circuit 600 that can be affected by the changing delay ofcircuit 600.

FIG. 7 illustrates an example of registers that can be used to generatesignals SELA, SELA#, SELB, SELB#, and SELC, according to an embodimentof the present invention. FIG. 7 illustrates three flip-flops 701-703.Each of delay circuits 201A-201H has a separate set of flip-flops701-703.

Flip-flops 701-703 prevent variable delay circuit 600 from generatingglitches in output clock signal CLKOUT when the delay path of CLKIN ischanged. As a result, flip-flops 701-703 reduce jitter in CLKOUT.

Each of flip-flops 701-703 includes a D input, a clock input, a setinput, a Q output, and an inverted Q bar output. Control signals DCSX,DCSY, and DCSZ are transmitted to the D inputs of flip-flops 701, 702,and 703, respectively. Control signals DCSX, DCSY, and DCSZ aregenerated by a decoder based on the Gray coded value of count signalsCT[1:Q]. The output clock signal CLKOUT of variable delay circuit 600 istransmitted to the clock inputs of flip-flops 701-703. A Reset signal istransmitted to the set inputs of flip-flops 701-703. Flip-flops 701-703generate output signals SELA, SELB, and SELC, respectively, at their Qoutputs. Flip-flops 701-703 generate output signals SELA#, SELB#, andSELC#, respectively, at their inverted Q bar outputs. Signals SELA#,SELB#, and SELC# are the logical inverses of signals SELA, SELB, andSELC, respectively.

Flip-flops 701-703 store the logic states of the DCSX, DCSY, and DCSZsignals at their Q outputs as signals SELA, SELB, and SELC,respectively, in response to a rising edge in output clock signalCLKOUT. As a result, signals SELA, SELB, SELC, SELA#, SELB#, and SELC#change state only after a rising edge in CLKIN has already propagatedthrough variable delay circuit 600 to cause a rising edge in CLKOUT.

FIG. 8 is a timing diagram that illustrates an example of the input andoutput clock signals CLKIN and CLKOUT of variable delay circuit 600. Asshown in FIG. 8, rising edges in CLKIN and CLKOUT are separated by thedelay of variable delay circuit 600. The time between a rising edge inCLKOUT and the next falling edge in CLKIN is referred to as the timingmargin. The timing margin provides sufficient time for flip-flops701-703 to change the logic states of the SELA, SELB, SELC, SELA#, andSELB# signals and for circuit 600 to change the path of CLKIN throughswitches 601-608 before the next edge in CLKIN. As a result, circuit 600changes the path of CLKIN through switches 601-608 when CLKIN and CLKOUThave stable logic states to prevent causing glitches in CLKOUT.

FIG. 9 illustrates an example of a variable delay circuit 900, accordingto an embodiment of the present invention. Variable delay circuit 900 isan example of each of the 1X delay circuit elements 201A-201H shown inFIG. 2. Thus, in one embodiment, each of the 1X delay circuit elements201A-201H includes the circuitry of variable delay circuit 900.According to another embodiment, variable delay circuit 900 can be usedin a ring oscillator in a phase-locked loop (PLL) circuit.

Variable delay circuit 900 includes 10 variable delay switches 901-910.Variable delay switch circuit 400 shown in FIGS. 4-5 is an examplecircuit architecture for each one of the variable delay switches901-910. Because variable delay switches 901-910 have the same circuitarchitecture, process variations have the same effects on the delays ofswitches 901-910.

Variable delay circuit 900 delays an input clock signal CLKIN togenerate an output clock signal CLKOUT. Eight decoded control signalsDCS[1:8] generated by a decoder control the delays of variable delayswitches 901 and 903. Eight decoded control signals DCS[9:16] generatedby a decoder control the delay of variable delay switch 902. Eightdecoded control signals DCS[17:24] generated by a decoder control thedelay of variable delay switch 907. Eight decoded control signalsDCS[25:32] generated by a decoder control the delay of variable delayswitch 908.

The delays of variable delay switches 901-903 and 907-908 vary based onchanges in the decoded control signals DCS[1:32]. Decoded controlsignals DCS[1:32] are generated based on the decoded value of countsignals CT[1:Q]. Decoded control signals DCS[1:32] vary the delay of oneof the variable delay switches 901-903 and 907-908 in response to eachchange in the logic states of the count signals CT[1:Q] from counter203, for example, by turning on or turning off more of the transistors502A-502H and 506A-506H in the current starving inverter 402 in thatvariable delay switch.

Fixed delay control signals FDS are transmitted to inputs of variabledelay switches 904-906 and 909-910, as shown in FIG. 9. Fixed delaycontrol signals FDS are set to constant logic states that do not varyduring the operation of DLL 200. Fixed delay control signals FDS causethe delays of variable delay switches 904-906 and 909-910 to be set totheir smallest programmable delay values. For example, fixed delaycontrol signals FDS can be set to logic states that cause all oftransistors 502A-502H and 506A-506H to be turned on so that variabledelay switches 904-906 and 909-910 provide their minimum programmabledelay values to their output clock signals at outputs O. Control signalsFDS cause variable delay switches 904-906 and 909-910 to remain at theirminimum programmable delay values during the operation of DLL 200.

The delay that variable delay circuit 900 provides to output clocksignal CLKOUT relative to input clock signal CLKIN can be varied bychanging the delay path that CLKIN takes through variable delay switches901-910 to generate CLKOUT. The logic states of select signals SELA,SELA#, SELB, SELB#, and SELC control the delay path that CLKIN takesthrough variable delay switches 901-910 to generate CLKOUT. The logicstates of select signals SELA, SELA#, SELB, SELB#, and SELC are variedto change the delay path that CLKIN takes through variable delayswitches 901-910 to generate CLKOUT.

Select signal SELA is transmitted to the S input of variable delayswitch 901, and select signal SELA# is transmitted to the S input ofvariable delay switch 903. When SELA is in a logic high state, and SELA#is in a logic low state, CLKIN is routed through two variable delayswitches 901-902 that have variable delays to generate CLKOUT. The delayof circuit 900 is varied by varying the delays of switches 901-902 basedon changes in the count signals CT[1:Q].

Select signal SELB is transmitted to the S input of variable delayswitch 904, and select signal SELB# is transmitted to the S input ofvariable delay switch 906. When the delays of variable delay switches901-902 have both reached their maximum values, DLL 200 changes SELA toa logic low state, SELA# to a logic high state, SELB to a logic highstate, and SELB# to a logic low state to provide additional increases inthe delay of circuit 900. When SELA is in a logic low state, SELA# is ina logic high state, SELB is in a logic high state, and SELB# is in alogic low state, CLKIN is routed through variable delay switches 903,904, 905, and 902, in that order, to generate CLKOUT. Thus, CLKIN isrouted through two variable delay switches that have variable delays andtwo variable delay switches programmed to have fixed delays. The delaysof switches 902-903 are set to their minimum values, and the delay ofcircuit 900 is then increased by increasing the delays of switches902-903 based on changes in the count signals CT[1:Q].

Select signal SELC is transmitted to the S input of variable delayswitch 909, and supply voltage VCC is transmitted to the S inputs ofvariable delay switches 907-908 and 910. When the delays of variabledelay switches 902-903 have both reached their maximum values, DLL 200changes SELB to a logic low state, SELB# to a logic high state, and SELCto a logic high state to provide additional increases in the delay ofcircuit 900. When SELA is in a logic low state, SELA# is in a logic highstate, SELB is in a logic low state, SELB# is in a logic high state, andSELC is in a logic high state, CLKIN is routed through variable delayswitches 903, 906, 907, 908, 909, 910, 905, and 902, in that order, togenerate CLKOUT. Thus, CLKIN is routed through four variable delayswitches that have variable delays and four variable delay switches thatare programmed to have fixed delays. Also, the delays of switches902-903 and 907-908 are set to their minimum delays. The delay ofcircuit 900 is then increased by increasing the delays of switches902-903 and 907-908 based on changes in the count signals CT[1:Q].

According to another embodiment of a variable delay circuit, the path ofCLKIN through the variable delay circuit can be rerouted through 6variable delay switches that have variable delays and 6 variable delayswitches that are programmed to have fixed delays. In yet anotherembodiment of a variable delay circuit, the path of CLKIN through thevariable delay circuit can be rerouted through 8 variable delay switchesthat have variable delays and 8 variable delay switches that areprogrammed to have fixed delays.

FIG. 10 is a simplified partial block diagram of a field programmablegate array (FPGA) 1000 that can include aspects of the presentinvention. FPGA 1000 is merely one example of an integrated circuit thatcan include features of the present invention.

Embodiments of the present invention can be used in numerous types ofintegrated circuits, such as field programmable gate arrays (FPGAs),programmable logic devices (PLDs), complex programmable logic devices(CPLDs), programmable logic arrays (PLAs), application specificintegrated circuits (ASICs), general purpose processors, centralprocessing units (CPUs), digital signal processors, controllerintegrated circuits, memory integrated circuits, analog integratedcircuits, and digital integrated circuits.

FPGA 1000 includes a two-dimensional array of programmable logic arrayblocks (or LABs) 1002 that are interconnected by a network of column androw interconnect conductors of varying length and speed. LABs 1002include multiple (e.g., 10) logic elements (or LEs).

An LE is a programmable logic circuit block that provides for efficientimplementation of user defined logic functions. An FPGA has numerouslogic elements that can be configured to implement various combinatorialand sequential functions. The logic elements have access to aprogrammable interconnect structure. The programmable interconnectstructure can be programmed to interconnect the logic elements in almostany desired configuration.

FPGA 1000 also includes a distributed memory structure including randomaccess memory (RAM) blocks of varying sizes provided throughout thearray. The RAM blocks include, for example, blocks 1004, blocks 1006,and block 1008. These memory blocks can also include shift registers andfirst-in-first-out (FIFO) buffers.

FPGA 1000 further includes digital signal processing (DSP) blocks 1010that can implement, for example, multipliers with add or subtractfeatures. Input/output elements (IOEs) 1012 located, in this example,around the periphery of the chip, support numerous single-ended anddifferential input/output standards. IOEs 1012 are coupled to pins. Eachof the pins is an external terminal of the FPGA. It is to be understoodthat FPGA 1000 is described herein for illustrative purposes only andthat the present invention can be implemented in many different types ofintegrated circuits.

The present invention can also be implemented in a system that has anFPGA as one of several components. FIG. 11 shows a block diagram of anexemplary digital system 1100 that can embody techniques of the presentinvention. System 1100 can be a programmed digital computer system,digital signal processing system, specialized digital switching network,or other processing system. Moreover, such systems can be designed for awide variety of applications such as telecommunications systems,automotive systems, control systems, consumer electronics, personalcomputers, Internet communications and networking, and others. Further,system 1100 can be provided on a single board, on multiple boards, orwithin multiple enclosures.

System 1100 includes a processing unit 1102, a memory unit 1104, and aninput/output (I/O) unit 1106 interconnected together by one or morebuses. According to this exemplary embodiment, an FPGA 1108 is embeddedin processing unit 1102. FPGA 1108 can serve many different purposeswithin the system of FIG. 11. FPGA 1108 can, for example, be a logicalbuilding block of processing unit 1102, supporting its internal andexternal operations. FPGA 1108 is programmed to implement the logicalfunctions necessary to carry on its particular role in system operation.FPGA 1108 can be specially coupled to memory 1104 through connection1110 and to I/O unit 1106 through connection 1112.

Processing unit 1102 can direct data to an appropriate system componentfor processing or storage, execute a program stored in memory 1104,receive and transmit data via I/O unit 1106, or other similar functions.Processing unit 1102 can be a central processing unit (CPU),microprocessor, floating point coprocessor, graphics coprocessor,hardware controller, microcontroller, field programmable gate arrayprogrammed for use as a controller, network controller, or any type ofprocessor or controller. Furthermore, in many embodiments, there isoften no need for a CPU.

For example, instead of a CPU, one or more FPGAs 1108 can control thelogical operations of the system. As another example, FPGA 1108 acts asa reconfigurable processor that can be reprogrammed as needed to handlea particular computing task. Alternatively, FPGA 1108 can itself includean embedded microprocessor. Memory unit 1104 can be a random accessmemory (RAM), read only memory (ROM), fixed or flexible disk media,flash memory, tape, or any other storage means, or any combination ofthese storage means.

The foregoing description of the exemplary embodiments of the presentinvention has been presented for the purposes of illustration anddescription. The foregoing description is not intended to be exhaustiveor to limit the present invention to the examples disclosed herein. Insome instances, features of the present invention can be employedwithout a corresponding use of other features as set forth. Manymodifications, substitutions, and variations are possible in light ofthe above teachings, without departing from the scope of the presentinvention.

1. A feedback loop circuit comprising: a phase detector that generatesan output signal based on a delayed periodic signal; and delay circuitscoupled in a delay chain that delays the delayed periodic signal,wherein each of the delay circuits comprises variable delay blocks andfixed delay blocks that are coupled to form at least two delay paths foran input signal through the delay circuit to generate a delayed outputsignal, wherein delays of the variable delay blocks in the delaycircuits vary based on the output signal of the phase detector, andwherein each of the delay circuits reroutes the input signal through adifferent one of the delay paths to generate the delayed output signalbased on the output signal of the phase detector during operation of thefeedback loop circuit.
 2. The feedback loop circuit defined in claim 1wherein each of the delay circuits comprises a first delay path throughat least two of the variable delay blocks and a second delay paththrough at least two of the variable delay blocks and at least two ofthe fixed delay blocks, and wherein each of the delay circuits changes apath of the input signal from the first delay path to the second delaypath in the delay circuit based on the output signal of the phasedetector to provide additional variability in a delay provided to thedelayed periodic signal.
 3. The feedback loop circuit defined in claim 2wherein each of the delay circuits comprises a third delay path throughat least two of the variable delay blocks and at least four of the fixeddelay blocks, and wherein each of the delay circuits changes a path ofthe input signal from the second delay path to the third delay path inthe delay circuit based on the output signal of the phase detector toprovide additional variability in the delay provided to the delayedperiodic signal.
 4. The feedback loop circuit defined in claim 2 whereineach of the delay circuits comprises a third delay path through at leastfour of the variable delay blocks and at least four of the fixed delayblocks, and wherein each of the delay circuits changes a path of theinput signal from the second delay path to the third delay path in thedelay circuit based on the output signal of the phase detector toprovide additional variability in the delay provided to the delayedperiodic signal.
 5. The feedback loop circuit defined in claim 1 whereinthe variable delay blocks and the fixed delay blocks in each of thedelay circuits are coupled to form at least three delay paths for theinput signal through the delay circuit to generate the delayed outputsignal.
 6. The feedback loop circuit defined in claim 1 wherein each ofthe delay circuits further comprises a multiplexer circuit coupled tooutputs of the fixed delay blocks, at least two of the variable delayblocks are coupled in series in each of the delay circuits to generate adelayed output signal, a first one of the fixed delay blocks delays thedelayed output signal of the variable delay blocks to generate a delayedoutput signal, and a second one of the fixed delay blocks delays thedelayed output signal of the first one of the fixed delay blocks togenerate a delayed output signal.
 7. The feedback loop circuit definedin claim 6 wherein a third one of the fixed delay blocks delays thedelayed output signal of the second one of the fixed delay blocks togenerate a delayed output signal, a fourth one of the fixed delay blocksdelays the delayed output signal of the third one of the fixed delayblocks to generate a delayed output signal, and the multiplexer circuitis configured to select the delayed output signal of one of the fixeddelay blocks to generate the delayed output signal of the delay circuit.8. The feedback loop circuit defined in claim 1 wherein each of thevariable delay blocks and each of the fixed delay blocks comprises acurrent starving inverter circuit, and wherein variable delaytransistors in each of the fixed delay blocks remain turned on.
 9. Thefeedback loop circuit defined in claim 1 further comprising: a countercircuit that generates Gray coded count signals based on the outputsignal of the phase detector, wherein the Gray coded count signals areused to program delays of the variable delay blocks in the delaycircuits, and wherein the Gray coded count signals are used to selectthe delay path for the input signal through each of the delay circuits.10. The feedback loop circuit defined in claim 1 wherein each of thevariable and the fixed delay blocks in each of the delay circuits has afirst input coupled to receive a select signal and a second inputcoupled to receive the input signal, wherein select signals select thedelay path of the input signal through the delay circuit, and whereinthe feedback loop circuit is a delay-locked loop.
 11. A feedback loopcircuit comprising: a phase detector generating an output signal inresponse to a delayed periodic signal; and a delay line comprising delaycircuits coupled in series that delay a periodic signal to provide adelay to the delayed periodic signal, wherein each of the delay circuitscomprises adjustable delay blocks that are configurable to route aninput signal through either one of at least two different delay pathsthrough the adjustable delay blocks to generate a delayed output signal,wherein delays of a first set of the adjustable delay blocks vary basedon the output signal of the phase detector, and wherein delays of asecond set of the adjustable delay blocks remain constant in response tofixed delay signals when the feedback loop circuit is operating.
 12. Thefeedback loop circuit defined in claim 11 wherein each of the delaycircuits reroutes the input signal through a different one of the delaypaths to generate the delayed output signal in response to a change in asignal generated based on the output signal of the phase detector. 13.The feedback loop circuit defined in claim 11 wherein each of the delaycircuits comprises a first delay path through at least two of theadjustable delay blocks in the first set and a second delay path throughat least two of the adjustable delay blocks in the first set and atleast two of the adjustable delay blocks in the second set, and whereineach of the delay circuits changes a path of the input signal from thefirst delay path to the second delay path based on the output signal ofthe phase detector to provide additional variability in the delayprovided to the delayed periodic signal.
 14. The feedback loop circuitdefined in claim 13 wherein each of the delay circuits comprises a thirddelay path through at least two of the adjustable delay blocks in thefirst set and at least four of the adjustable delay blocks in the secondset, and wherein each of the delay circuits changes a path of the inputsignal from the second delay path to the third delay path based on theoutput signal of the phase detector to provide additional variability inthe delay provided to the delayed periodic signal.
 15. The feedback loopcircuit defined in claim 13 wherein each of the delay circuits comprisesa third delay path through at least four of the adjustable delay blocksin the first set and at least four of the adjustable delay blocks in thesecond set, and wherein each of the delay circuits changes a path of theinput signal from the second delay path to the third delay path based onthe output signal of the phase detector to provide additionalvariability in the delay provided to the delayed periodic signal. 16.The feedback loop circuit defined in claim 11 wherein each of the delaycircuits further comprises a multiplexer circuit that receives outputsignals from at least two of the adjustable delay blocks in the secondset, and wherein the multiplexer circuit selects an output signal of oneof the adjustable delay blocks in the second set as the delayed outputsignal of the delay circuit.
 17. The feedback loop circuit defined inclaim 11 wherein each of the adjustable delay blocks in each of thedelay circuits have a first input coupled to receive a select signal anda second input coupled to receive the input signal, and wherein selectsignals select the delay path of the input signal through the delaycircuit.
 18. The feedback loop circuit defined in claim 17 wherein eachof the delay circuits further comprises flip-flops that generate theselect signals in response to the delayed output signal, and wherein theflip-flops generate values of the select signals based on signalsgenerated in response to the output signal of the phase detector. 19.The feedback loop circuit defined in claim 11 wherein the feedback loopcircuit is a delay-locked loop circuit.
 20. A method for generating adelayed clock signal, the method comprising: comparing phases of firstand second clock signals to generate a phase comparison signal; delayingthe second clock signal using delay circuits coupled in a delay chain byrouting an input signal through a delay path in each of the delaycircuits, wherein first and second adjustable delay blocks in each ofthe delay circuits are coupled to form at least two delay paths for theinput signal through the delay circuit, wherein delays of the firstadjustable delay blocks vary based on changes in the phase comparisonsignal, and wherein delays of the second adjustable delay blocks remainconstant in response to fixed delay signals; and rerouting the inputsignal through a different one of the delay paths in one of the delaycircuits based on the phase comparison signal.
 21. The method defined inclaim 20 wherein rerouting the input signal through a different one ofthe delay paths in one of the delay circuits based on the phasecomparison signal further comprises changing a delay path of the inputsignal from a first delay path through at least two of the firstadjustable delay blocks to a second delay path through at least two ofthe first adjustable delay blocks and at least two of the secondadjustable delay blocks in the delay circuit.
 22. The method defined inclaim 20 wherein the first and the second adjustable delay blocks ineach of the delay circuits are coupled to form at least three delaypaths for the input signal through the delay circuit.